Cryo-electron energy loss spectroscpy: observations on vitrified hydrated specimens and radiation damageLEAPMAN, R. D; SUN, S.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 71-79, issn 0304-3991Conference Paper

Phase identification in carbon and BN systems by EELSSCHMID, H. K.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 99-111, issn 1154-2799Conference Paper

Some practical consequences of the Lorentzian angular distribution of inelastic scatteringEGERTON, R. F; WONG, K.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 169-180, issn 0304-3991Conference Paper

Conduction bandstructure in strained silicon by spatially resolved electron energy loss spectroscopyBATSON, P. E.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 63-70, issn 0304-3991Conference Paper

Delocalization in inelastic scatteringMULLER, D. A; SILCOX, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 195-213, issn 0304-3991Conference Paper

Energy-filtered transmission electron microscopy of Si_mGein superlattices and Si-Ge heterostructures. I: experimental resultsJÄGER, W; MAYER, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 33-45, issn 0304-3991Conference Paper

Development of the EXELFS technique for high accuracy structural informationQIAN, M; SARIKAYA, M; STERN, E. A et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 137-147, issn 0304-3991Conference Paper

Electron energy loss near edge structure (ELNES) on the carbon K-edge in transition metal carbides with the rock salt structureCRAVEN, A. J; GARVIE, L. A. J.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 89-98, issn 1154-2799Conference Paper

Dispersion of the valence electron energy loss in thin amorphous carbon films deposited by ion assisted evaporation of graphiteFALKE, U; WEBER, A.-K; ULLMANN, J et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 113-120, issn 1154-2799Conference Paper

Electron energy loss spectroscopy study of iron deposition in human alveolar macrophages: ferritin or hemosiderin?DIOCIAIUTI, M; FALCHI, M; PAOLETTI, L et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 33-40, issn 1154-2799Conference Paper

Imaging of nanometer-sized precipitates in solids by electron spectroscopy imagingHOFER, F; WARBICHLER, P; GROGGER, W et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 15-31, issn 0304-3991Conference Paper

In situ EELS and TEM observation of boron carbide (B₄C) during hydrogen- and helium-ion bombardmentsKUSHITA, K; HOJOU, K; FURUNO, S et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 149-157, issn 1154-2799Conference Paper

Quantitative surface chemical mapping with Auger and backscattered electron signalsPRUTTON, M; BARKSHIRE, I. R; CRONE, M et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 47-62, issn 0304-3991Conference Paper

An EELS and XAS study of cubic boron nitride synthesized under high pressure-high temperature conditionsJAOUEN, M; HUG, G; GONNET, V et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 127-139, issn 1154-2799Conference Paper

Analyzing line scan EELS data with neural pattern recognitionGATTS, C; DUSCHER, G; MÜLLEJANS, H et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 229-239, issn 0304-3991Conference Paper

Energy-filtered convergent-beam diffraction: examples and future prospectsMIDGLEY, P. A; SAUNDERS, M; VINCENT, R et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 1-13, issn 0304-3991Conference Paper

Recent studies of near-edge structureBROWN, L. M; WALSH, C. A; DRAY, A et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 121-125, issn 1154-2799Conference Paper

Modelling the bonding at metal-ceramic interfaces using PEELS in the STEMBRYDSON, R; BRULEY, J; MÜLLEJANS, H et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 81-92, issn 0304-3991Conference Paper

Momentum dependent energy loss near edge structures using a CTEM: the reliability of the methods availableBOTTON, G. A; BOOTHROYD, C. B; STOBBS, W. M et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 93-107, issn 0304-3991Conference Paper

Spectrum-line profile analysis of a magnesium aluminate spinel/sapphire interfaceBRULEY, J; MING-WEI TSENG; WILLIAMS, D. B et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 1-18, issn 1154-2799Conference Paper

A quantitative approach for spatially-resolved electron energy-loss spectroscopy of grain boundaries and planar defects on a subnanometer scaleGU, H; CEH, M; STEMMER, S et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 215-227, issn 0304-3991Conference Paper

An imaging filter for biological applicationsKRIVANEK, O. L; FRIEDMAN, S. L; GUBBENS, A. J et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 267-282, issn 0304-3991Conference Paper

Interactive image-spectrum EELS: application to elemental mapping of lubricant colloidsMARTIN, J.-M; LAVERGNE, J.-L; VACHER, B et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 53-63, issn 1154-2799Conference Paper

Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy-dispersive X-ray microanalysisOLESHKO, V; GIJBELS, R; JACOB, W et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 79-88, issn 1154-2799Conference Paper

In situ EELS and TEM observation of Al implanted with nitrogen ionsHOJOU, K; FURUNO, S; TSUKAMOTO, T et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 141-147, issn 1154-2799Conference Paper